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First-order sensitivity analysis of quartz crystal resonator model parameters
1Dept. of Electr. Eng., Univ. of Central Florida, Orlando, FL.
Summary
This study analyzes measurement sensitivity in quartz resonators, predicting motional arm resistance variations. Results from theory, simulation, and experiments show good agreement, validating the analysis method.
Area of Science:
- Electrical Engineering
- Materials Science
- Physics
Background:
- Quartz resonator devices are critical components in electronic circuits.
- Accurate modeling of resonator behavior is essential for reliable performance.
- Understanding sensitivity to measurement errors is key for device characterization.
Purpose of the Study:
- To perform a first-order measurement sensitivity analysis on a single-mode quartz resonator device model.
- To predict variations in motional arm resistance relative to the resonance S-parameter due to measurement errors.
- To validate the sensitivity analysis through computer simulation and experimental verification.
Main Methods:
- Developed a first-order sensitivity analysis for a quartz resonator model.
- Extracted model parameters according to the EIA-512 standard.
- Verified the analysis using computer simulations and experimental measurements.
Main Results:
- The analysis accurately predicts variations in motional arm resistance versus the resonance S-parameter.
- Theoretical predictions, simulation outcomes, and experimental data demonstrate strong agreement.
- The EIA-512 standard provided a reliable method for parameter extraction.
Conclusions:
- The first-order measurement sensitivity analysis is a valid and accurate method for quartz resonators.
- The study confirms good agreement between theoretical analysis, simulation, and experimental results.
- This work contributes to the precise characterization and modeling of quartz resonator devices.
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