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Related Experiment Videos

A quantitative acoustic microscope with multiple detection modes.

J R Weaver1, C W Daft, G D Briggs

  • 1IBM Thomas J. Watson Res. Center, Yorktown Heights, NY.

IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
|January 1, 1989
PubMed
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This study introduces an acoustic microscope capable of both toneburst and impulse excitation for detailed surface wave analysis. The new method improves crack imaging and characterization in materials like glass and duralumin.

Area of Science:

  • Materials Science
  • Acoustic Microscopy
  • Surface Physics

Background:

  • Conventional acoustic microscopy often produces complex images of material defects.
  • Understanding surface wave propagation is crucial for material characterization.
  • Existing methods may struggle to resolve fine details of cracks.

Purpose of the Study:

  • To present a novel acoustic microscope with dual excitation modes (toneburst and impulse).
  • To demonstrate the capability of resolving and analyzing surface wave signals in time domain.
  • To investigate the characterization of cracks and V(z) processing using this advanced technique.

Main Methods:

  • Development of an acoustic microscope with selectable toneburst and impulse excitation.
  • Implementation of mechanical scanning in arbitrary directions.

Related Experiment Videos

  • Time-resolved analysis of specular and Rayleigh signals for surface wave parameter extraction.

    • Main Results:

    • Successful measurement of surface wave propagation parameters.
    • Quantification of reflection and transmission coefficients for cracks.
    • Observation of diffraction effects from crack tips, clarifying complex imaging in conventional methods.

    Conclusions:

    • The dual-mode acoustic microscope offers enhanced capabilities for material defect analysis.
    • Impulse excitation provides superior resolution for surface wave phenomena and crack characterization.
    • This technique offers significant advantages over conventional toneburst scanning acoustic microscopy (SAM) for imaging cracks.