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Updated: Jul 7, 2026

Elemental-sensitive Detection of the Chemistry in Batteries through Soft X-ray Absorption Spectroscopy and Resonant Inelastic X-ray Scattering
Published on: April 17, 2018
An extraction algorithm for core-level excitations in non-resonant inelastic X-ray scattering spectra
H Sternemann1, C Sternemann, G T Seidler
1Fakultät Physik/DELTA, Technische Universität Dortmund, Maria-Göppert-Mayer-Strasse 2, D-44221 Dortmund, Germany. henning.sternemann@uni-dortmund.de
This study presents a new algorithm for subtracting background noise in non-resonant inelastic X-ray scattering (NIXS) spectra. This method improves the analysis of core electron excitations and shallow absorption edges in various materials.
Area of Science:
- Materials Science
- Condensed Matter Physics
- Atomic and Molecular Physics
Background:
- Non-resonant inelastic X-ray scattering (NIXS) probes site-selective electronic structures.
- Analyzing NIXS spectra is challenging due to complex background signals from electron excitations.
- Accurate background subtraction is crucial for studying shallow absorption edges, especially in liquids and under extreme conditions.
Purpose of the Study:
- To develop and present an algorithm for effective background subtraction in NIXS spectra.
- To address the momentum-transfer dependence of background signals in NIXS analysis.
- To demonstrate the algorithm's utility for analyzing core electron excitations.
Main Methods:
- Developed a novel algorithm for NIXS spectral analysis.
- Applied the algorithm to subtract background signals from valence and core electron excitations.
- Validated the algorithm using silicon and silicon dioxide samples.
Main Results:
- The algorithm successfully extracts target absorption edges from complex backgrounds.
- Demonstrated effective background subtraction across a wide range of momentum transfers.
- The method is applicable to various materials, including liquids and samples under extreme conditions.
Conclusions:
- The presented algorithm significantly enhances the analysis of NIXS data.
- It provides a reliable method for isolating site-selective electronic structure information.
- This advancement facilitates deeper understanding of materials under diverse conditions.
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