Advanced cantilevers for magnetic force microscopy and high frequency magnetic force microscopy

M R Koblischka1, J D Wei, C Richter

  • 1Institute of Experimental Physics, Saarland University, Saarbrücken, Germany. m.koblischka@mx.uni-saarland.de

Scanning
|February 28, 2008
PubMed
Summary

Advanced magnetic force microscopy (MFM) tips improve spatial resolution for magnetic recording analysis. However, the 10 nm CoCr coating limits high-frequency magnetic force microscopy (HF-MFM) performance to 500 MHz.