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Optimizing Magnetic Force Microscopy Resolution and Sensitivity to Visualize Nanoscale Magnetic Domains
Published on: July 20, 2022
Advanced cantilevers for magnetic force microscopy and high frequency magnetic force microscopy
M R Koblischka1, J D Wei, C Richter
1Institute of Experimental Physics, Saarland University, Saarbrücken, Germany. m.koblischka@mx.uni-saarland.de
Scanning
|February 28, 2008
Summary
Advanced magnetic force microscopy (MFM) tips improve spatial resolution for magnetic recording analysis. However, the 10 nm CoCr coating limits high-frequency magnetic force microscopy (HF-MFM) performance to 500 MHz.
Area of Science:
- Materials Science
- Nanotechnology
- Physics
Background:
- Magnetic Force Microscopy (MFM) is crucial for nanoscale magnetic imaging.
- Improving spatial resolution and reducing invasiveness are key challenges in MFM.
- High-Frequency MFM (HF-MFM) extends MFM capabilities to study dynamic magnetic fields.
Purpose of the Study:
- To enhance the spatial resolution of MFM and HF-MFM.
- To evaluate the performance of advanced MFM tips fabricated using focused ion beam (FIB) milling.
- To assess the low invasiveness and frequency limitations of the new MFM tips.
Main Methods:
- Fabrication of advanced MFM tips using focused ion beam (FIB) milling.
- Application of a 10 nm CoCr magnetic film on the MFM tips.
- MFM measurements on hard disk test samples and garnet films.
- HF-MFM characterization of magnetic recording writer poles (100-1,000 MHz).
Main Results:
- Advanced MFM tips demonstrate significantly improved spatial resolution compared to standard tips.
- MFM measurements on garnet films show low invasiveness.
- HF-MFM imaging with advanced tips reveals superior resolution at operating conditions.
- The 10 nm CoCr coating on advanced tips functions effectively up to approximately 500 MHz.
Conclusions:
- FIB-milled MFM tips with CoCr coating offer enhanced spatial resolution for MFM applications.
- These advanced tips are suitable for low-invasiveness MFM and HF-MFM up to 500 MHz.
- Further development is needed to extend the high-frequency performance of advanced MFM tips.
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