A Shemer1, D Mendlovic, G Shabtay
1Faculty of Engineering, Tel-Aviv University, Tel Aviv 69978, Israel.
You might also read
Articles linked to this work by shared authors, journal, and citation graph.
A modified morphological correlator using binary slicing offers improved pattern recognition. This approach requires fewer calculations and achieves higher discrimination than conventional methods.
Area of Science:
Background:
Purpose of the Study:
Main Methods:
Main Results:
Conclusions: