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Updated: Jul 6, 2026

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
1Advanced Optical Memory Research Group, National Institute for Advanced Interdisciplinary Research, 1-1-4 Higashi, Tsukuba, Ibaraki 305-8562, Japan. mblee@nair.go.jp
We developed a novel silicon probe array for high-density near-field optical storage. This new design offers faster data rates and improved durability compared to traditional fiber probes.
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