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Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes

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Published on: May 23, 2017

Intensity-modulated moiré topography.

C Lu¹, S Inokuchi

¹Department of Systems and Human Science, Graduate School of Engineering Science, Osaka University, 1-3 Machikaneyama-cho, Toyonaka, Osaka 560-8531, Japan. lu@inolab.sys.es.osaka-u.ac.jp

|March 8, 2008

Summary

This summary is machine-generated.

This study introduces an intensity-modulated moiré topography method to solve the fringe order ambiguity problem in 3D measurements. This technique enables precise absolute depth range determination from a single image, even for discontinuous fringes.

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Area of Science:

Optics and Photonics
Metrology and Measurement Science

Background:

Moiré topography offers single-image 3D measurement but struggles with fringe order ambiguity.
Existing methods face challenges in determining absolute phase and depth for discontinuous or isolated objects.

Purpose of the Study:

To present an intensity-modulated moiré topography method to overcome fringe order ambiguity.
To enable absolute depth range determination from a single image without user interaction.

Main Methods:

Modulating projection and observation grating transmission factors using exponential functions.
Generating moiré patterns where fringe intensity correlates with fringe order.
Extracting fringe order directly from fringe intensity for absolute phase and depth calculation.

Main Results:

Successfully produced moiré patterns with intensity-modulated fringes.
Enabled easy extraction of fringe order from fringe intensity.
Achieved absolute depth range determination for skeleton lines solely from intensity.
Facilitated moiré pattern segmentation by fringe order.

Conclusions:

The intensity-modulated moiré topography method effectively resolves fringe order ambiguity.
Absolute phase and depth can be obtained from single-image intensity modulation, simplifying 3D measurements.
This technique offers a user-independent solution for precise 3D surface profiling.