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Published on: July 21, 2018
Refractive-index and thickness sensitivity in surface plasmon resonance spectroscopy
T Akimoto1, S Sasaki, K Ikebukuro
1Research Center for Advanced Science and Technology, University of Tokyo, 4-6-1 Komaba, Meguro-ku, Tokyo 153-8904, Japan.
Applied Optics
|March 8, 2008
Summary
Surface plasmon resonance spectroscopy sensitivity increases with smaller incident angles. This study confirms higher sensitivity for refractive index sensing using optimized SPR parameters.
Area of Science:
- Optics and Photonics
- Materials Science
- Analytical Chemistry
Background:
- Surface plasmon resonance (SPR) spectroscopy is a label-free optical sensing technique.
- SPR sensitivity is crucial for detecting subtle changes in refractive index.
- Optimizing SPR parameters can enhance sensing performance.
Purpose of the Study:
- To investigate the influence of incident angle on SPR spectroscopy sensitivity.
- To determine the relationship between SPR sensitivity, refractive index, and thin film thickness.
- To experimentally validate the calculated SPR sensitivities.
Main Methods:
- Calculated SPR sensitivities for liquid samples and dielectric thin layers at incident angles from 66-76 degrees.
- Experimentally measured refractive indices (1.3311-1.3463) and thin film thicknesses (0-89 nm).
- Analyzed the resonant wavelength's linearity with refractive index and thickness.
Main Results:
- SPR sensitivity significantly increases as the incident angle decreases.
- Sensitivity at 66 degrees incident angle was seven times greater than at 76 degrees.
- Resonant wavelength showed a linear relationship with refractive index and thickness (except at 66 degrees).
Conclusions:
- Smaller incident angles enhance SPR spectroscopy sensitivity for refractive index sensing.
- SPR performance is dependent on incident angle, refractive index, and thin film thickness.
- The findings provide insights for optimizing SPR-based sensor design.
