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UV–Vis Spectrometers01:14

UV–Vis Spectrometers

The absorbance of UV and visible (UV–visible) radiations is measured using a UV–visible spectrophotometer. Deuterium lamps, which emit UV radiation, and tungsten lamps, which produce radiation in the visible region, are used as light sources in UV–visible spectrophotometers. A monochromator or prism is used for diffraction grating, i.e., to split the incoming radiation into different wavelengths. A system of slits is used to focus the desired wavelength on the sample cell. Samples for...
UV–Vis Spectroscopy: Woodward–Fieser Rules01:29

UV–Vis Spectroscopy: Woodward–Fieser Rules

UV–Visible absorption spectra of conjugated dienes arise from the lowest energy π → π* transitions. The light-absorbing part of the molecule is called the chromophore, and the substituents directly attached to the chromophore are called auxochromes. A strong correlation exists between the absorption maxima, λmax, and the structure of a conjugated π system. The Woodward–Fieser rules predict the value of λmax for a given structure by adding the contributions...

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Related Experiment Video

Updated: Jul 6, 2026

Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
09:32

Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films

Published on: January 26, 2016

Windows in ellipsometry measurements.

G E Jellison1

  • 1Solid State Division, Oak Ridge National Laboratory, Building 3025 MS 6030, PO Box 2008, Oak Ridge, Tennessee 37831-2008, USA.

Applied Optics
|March 8, 2008
PubMed
Summary

Ellipsometry measurements are affected by windows or lenses, requiring three parameters to describe window retardation. Two parameters can be measured simultaneously with isotropic samples, but the third requires separate measurement.

Area of Science:

  • Optical Physics
  • Materials Science
  • Metrology

Background:

  • Ellipsometry is a powerful technique for characterizing material properties.
  • The presence of optical elements like windows or lenses can introduce systematic errors.
  • Understanding and correcting for these effects is crucial for accurate measurements.

Purpose of the Study:

  • To investigate the impact of windows/lenses on general ellipsometry measurements.
  • To determine the parameters needed to describe window retardation effects.
  • To develop methods for measuring and correcting these effects.

Main Methods:

  • Theoretical analysis of ellipsometry measurements with intervening optical elements.
  • Experimental measurement of window retardation using a two-modulator generalized ellipsometer.

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Last Updated: Jul 6, 2026

Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films
09:32

Cooling Rate Dependent Ellipsometry Measurements to Determine the Dynamics of Thin Glassy Films

Published on: January 26, 2016

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  • Application of measured window parameters to correct sample data.

    • Main Results:

    • Three parameters are necessary to describe window retardation effects in ellipsometry.
    • Two window parameters can be measured concurrently with isotropic sample parameters.
    • The third window parameter and parameters for anisotropic samples require separate measurements.

    Conclusions:

    • Window retardation significantly impacts ellipsometry accuracy.
    • A method is presented to measure and correct for window effects.
    • Accurate characterization of optical elements is essential for reliable ellipsometry data.