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Updated: Jul 6, 2026

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
Published on: July 5, 2016
Hongze Liu1, Aaron R Hawkins, Stephen M Schultz
1Department of Electrical and Computer Engineering, Brigham Young University, Provo, UT 84660, USA.
Scanning (electrical) impedance imaging (SII) reconstructs electrical properties of tissues. This study presents a fast inverse method using convolution for accurate conductivity imaging of biological samples.
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