Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Experiment Videos

Particle-size analysis by laser diffraction with a complementary metal-oxide semiconductor pixel array.

Z Ma1, H G Merkus, B Scarlett

  • 1Particle Technology Group, Delft University of Technology, Julianalaan 136, 2628 BL Delft, The Netherlands. z.ma@tnw.tudelft.nl

Applied Optics
|March 20, 2008
PubMed
Summary
This summary is machine-generated.

Related Concept Videos

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

[Supratentorial papillary glioneuronal tumors: a clinicopathological and genetic analysis of six cases].

Zhonghua bing li xue za zhi = Chinese journal of pathology·2026
Same author

Magneto-ionic control of magnetism through voltage-driven carbon transport.

Nature communications·2026
Same author

[Analysis of sensitization characteristics and changing trends of common allergens in a children's hospital in Shanghai City from 2020 to 2024].

Zhonghua yu fang yi xue za zhi [Chinese journal of preventive medicine]·2025
Same author

Imaging pancreatic cancer with [<sup>18</sup>F]F-AlF-NOTA-FAPI-04 positron emission tomography/computed tomography (PET/CT): distribution patterns and therapeutic implications.

Clinical radiology·2025
Same author

[DICER1-mutant primary intracranial sarcoma: analysis of five cases].

Zhonghua bing li xue za zhi = Chinese journal of pathology·2025
Same author

Time dynamics of elevated glucose and beta-hydroxybutyrate on beta cell mitochondrial metabolism.

Islets·2025
Same journal

Multifunctional reconfigurable terahertz metasurface based on vanadium dioxide phase transition: achieving broadband absorption and efficient polarization conversion.

Applied optics·2026
Same journal

High-Q-factor electromagnetically induced transparency utilizing quasi-bound states in the continuum in an all-dielectric terahertz metasurface.

Applied optics·2026
Same journal

Automated stitching interferometry for high-precision metrology of X-ray mirrors.

Applied optics·2026
Same journal

Experimental demonstration of an approach to designing a metal-dielectric DBR resonant cavity structure.

Applied optics·2026
Same journal

High-precision wavefront reconstruction from a single-shot interferogram using a physics-driven hybrid feature calibration network.

Applied optics·2026
Same journal

Ultra-high-Q Fano resonance based on coupled topological corner states in Kagome photonic crystals.

Applied optics·2026
See all related articles

This study introduces a new complementary metal-oxide semiconductor pixel sensor for laser diffraction particle sizing, significantly improving resolution and application flexibility compared to traditional photodiode detectors.

Area of Science:

  • Optics and Photonics
  • Materials Science
  • Analytical Chemistry

Background:

  • Traditional laser-diffraction instruments using photodiode detectors face limitations in particle-size resolution.
  • Accurate particle size distribution is crucial in various scientific and industrial applications.

Purpose of the Study:

  • To implement and evaluate a complementary metal-oxide semiconductor (CMOS) pixel sensor for enhanced particle-size measurement via laser diffraction.
  • To overcome the resolution limitations of existing photodiode-based systems.

Main Methods:

  • Development and calibration of a CMOS pixel sensor for laser diffraction measurements.
  • Implementation of advanced signal-processing and inversion algorithms for particle-size distribution retrieval.
  • Utilizing the sensor's high resolution, no-blooming, and wide dynamic range for direct scattering pattern analysis.

Related Experiment Videos

Main Results:

  • The CMOS sensor demonstrated improved particle-size resolution compared to conventional methods.
  • The system offers increased flexibility for a wider range of particle-sizing applications.
  • Per-pixel calibration ensures accurate and reliable measurements.

Conclusions:

  • The CMOS pixel sensor represents a significant advancement in laser diffraction particle-size analysis.
  • This technology enhances measurement accuracy and broadens the applicability of laser diffraction techniques.