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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Defect states at the TiO2(110) surface probed by resonant photoelectron diffraction

P Krüger1, S Bourgeois, B Domenichini

  • 1Institut Carnot de Bourgogne, UMR 5209 CNRS-Université de Bourgogne, BP 47870, 21078 Dijon Cedex, France.

Physical Review Letters
|March 21, 2008
PubMed

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