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Updated: Jul 6, 2026

Preparing an Isotopically Pure 229Th Ion Beam for Studies of 229mTh
Published on: May 3, 2019
Design and construction of a new chamber for measuring the thickness of alpha-particle sources
A Martín Sánchez1, M Jurado Vargas, M J Nuevo Sánchez
1Department of Physics, University of Extremadura, 06071 Badajoz, Spain. ams@unex.es
Abstract:
The thickness of charged-particle emitting sources can be determined by varying the incidence angle of particles using silicon semiconductor detectors. The differences in energy between the peaks for an alpha emission measured with different incident angles are due to the energy loss of alpha particles in the source. These shifts can thus be used to estimate the source thickness. A new detection chamber has been constructed for this purpose. Its advantage is the registration of the alpha particles emitted from a given source using up to three different detectors simultaneously. Monte Carlo simulation was used to help to determine the best measurement conditions and interpret the results.
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