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In Depth Analyses of LEDs by a Combination of X-ray Computed Tomography (CT) and Light Microscopy (LM) Correlated with Scanning Electron Microscopy (SEM)
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Thermal influences on optical properties of light-emitting diodes: a semiempirical model

A García-Botella1, A A Fernández-Balbuena, D Vázquez-Moliní

  • 1Departamento de Optica, Universidad Complutense de Madrid, Facultad de Ciencias Físicas, Ciudad Universitaria syn, 28040 Madrid, Spain. angelgb@eucmos.sim.ucm.es

Applied Optics
|March 22, 2008
PubMed

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