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Updated: Jul 6, 2026

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−
06:53

Photoelectron Imaging of Anions Illustrated by 310 Nm Detachment of F−

Published on: July 27, 2018

Development of a Jet-REMPI (Resonantly Enhanced Multiphoton Ionization) Continuous Monitor for Environmental

H Oser, M J Coggiola, G W Faris

    Applied Optics
    |March 22, 2008
    PubMed

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