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Semiconductor line source for low-coherence interferometry.

A V Zvyagin, M G Garcia-Webb, D D Sampson

    Applied Optics
    |March 22, 2008
    PubMed
    Summary
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    A novel semiconductor laser source below threshold is suitable for low-coherence interferometry. This laser offers 1.3 mW output power and 16 µm coherence length, ideal for precise measurements like contact lens profiling.

    Area of Science:

    • Optoelectronics
    • Optical Metrology

    Background:

    • Low-coherence interferometry requires specialized light sources.
    • Semiconductor lasers offer tunable and compact solutions.

    Purpose of the Study:

    • To demonstrate the suitability of a below-threshold semiconductor laser for low-coherence interferometry.
    • To characterize the performance of this novel laser source.

    Main Methods:

    • Operating a high-power semiconductor laser below its threshold current.
    • Measuring output power, coherence length, and line profile.
    • Utilizing the laser for contact lens line profile measurement.

    Main Results:

    • The laser source operates effectively below threshold.

    Related Experiment Videos

  • Achieved output power of 1.3 mW.
  • Demonstrated a spatially uniform coherence length of 16 µm at 86% of threshold current (250 mA) and 20°C.
  • Successfully verified its utility by measuring a contact lens line profile.

    • Conclusions:

    • Below-threshold operation of semiconductor lasers is viable for low-coherence interferometry.
    • The characterized laser source provides adequate performance for metrology applications.
    • This approach offers a practical and efficient method for optical measurements.