Total scatter factors of small beams: a multidetector and Monte Carlo study

The scope of this study was to estimate total scatter factors (S(c,p)) of the three smallest collimators of the Cyberknife radiosurgery system (5-10 mm in diameter), combining experimental measurements and Monte Carlo simulation. Two microchambers, a diode, and a diamond detector were used to collect experimental data. The treatment head and the detectors were simulated by means of a Monte Carlo code in order to calculate correction factors for the detectors and to estimate total scatter factors by means of a consistency check between measurement and simulation. Results for the three collimators were: S(c,p) (5 mm) = 0.677 +/- 0.004, S(c,p) (7.5 mm) = 0.820 +/- 0.008, S(c,p) (10 mm) = 0.871 +/- 0.008, all relative to the 60 mm collimator at 80 cm source-to-detector distance. The method also allows the full width at half maximum of the electron beam to be estimated; estimations made with different collimators and different detectors were in excellent agreement and gave a value of 2.1 mm. Correction factors to be applied to the detectors for the measurement of S(c,p) were consistent with a prevalence of volume effect for the microchambers and the diamond and a prevalence of scattering from high-Z material for the diode detector. The proposed method is more sensitive to small variations of the electron beam diameter with respect to the conventional method used to commission Monte Carlo codes, i.e., by comparison with measured percentage depth doses (PDD) and beam profiles. This is especially important for small fields (less than 10 mm diameter), for which measurements of PDD and profiles are strongly affected by the type of detector used. Moreover, this method should allow S(c,p) of Cyberknife systems different from the unit under investigation to be estimated without the need for further Monte Carlo calculation, provided that one of the microchambers or the diode detector of the type used in this study are employed. The results for the diamond are applicable only to the specific detector that was investigated due to excessive variability in manufacturing.