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Related Concept Videos

Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
Accelerated...
Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation01:26

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
There are three main types of inductively coupled plasma atomic emission spectroscopy  (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used.
Electron Microscope Tomography and Single-particle Reconstruction01:07

Electron Microscope Tomography and Single-particle Reconstruction

Transmission electron microscopy (TEM) can be used to determine the 3D structure of biological samples with the help of techniques such as electron microscope tomography and single-particle reconstruction. While single-particle reconstruction can examine macromolecules and macromolecular complexes in vitro conditions only, tomography permits the study of cell components or small cells in vivo.
Electron Tomography
Electron tomography can be performed either in TEM or STEM (scanning transmission...

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Related Experiment Video

Updated: Jul 5, 2026

The Evolution of Silica Nanoparticle-polyester Coatings on Surfaces Exposed to Sunlight
10:27

The Evolution of Silica Nanoparticle-polyester Coatings on Surfaces Exposed to Sunlight

Published on: October 11, 2016

Two-dimensional X-ray photoelectron spectroscopy for composite surface analysis.

Sefik Suzer, Hikmet Sezen, Aykutlu Dâna

    Analytical Chemistry
    |April 17, 2008
    PubMed
    Summary

    This study introduces a novel method using X-ray photoelectron spectroscopy (XPS) to analyze surface electrical properties. The technique reveals hidden correlations in composite materials by tracking frequency-dependent peak shifts under electrical pulses.

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    Area of Science:

    • Surface Science
    • Spectroscopy
    • Materials Characterization

    Background:

    • X-ray photoelectron spectroscopy (XPS) is a surface-sensitive quantitative spectroscopic technique.
    • Understanding electrical properties of composite surfaces is crucial for material development.
    • Existing methods may struggle to resolve complex surface electrical characteristics.

    Discussion:

    • A new method is presented for acquiring 2D XPS data based on frequency dependence.
    • Electrical square-wave pulses are used to modulate binding energy positions via charging effects.
    • Cross-correlation analysis of XPS peaks reveals intricate surface electrical behaviors.

    Key Insights:

    • The technique effectively elucidates electrical characteristics of composite surface structures.
    • It enables the resolution of correlations between overlapping or hidden XPS peaks.
    • Frequency dependence of XPS under electrical pulsing provides unique surface electrical information.

    Outlook:

    • Potential for advanced characterization of functional materials.
    • Application in understanding charge dynamics at interfaces.
    • Further development could lead to in-situ electrical property mapping.