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Updated: Jul 5, 2026

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A Silicon-tipped Fiber-optic Sensing Platform with High Resolution and Fast Response
Published on: January 7, 2019
Highly-sensitive and high-resolution all-fiber three-dimensional measurement system.
Takefumi Ohta1, Norihiko Nishizawa, Tetsuya Ozawa
1Division of Advanced Science and Biotechnology, Graduate School of Engineering,Osaka University, 2-1 Yamadaoka, Suita, Osaka 565-0871, Japan. ohta@photonics.mls.eng.osaka-u.ac.jp
Applied Optics
|May 2, 2008
Summary
This study presents an all-fiber 3D measurement system using an incoherent interferometer. It achieves high sensitivity and resolution for precise, fast, and long-range measurements.
Area of Science:
- Optics and Photonics
- Metrology
- Fiber Optics
Background:
- Traditional 3D measurement systems often face limitations in sensitivity, resolution, and scanning range.
- The need for non-contact, high-precision metrology in various industrial and scientific applications is growing.
Purpose of the Study:
- To demonstrate a practical all-fiber three-dimensional (3D) measurement system.
- To evaluate the system's performance in terms of sensitivity, axial resolution, scanning range, and speed.
- To assess the system's applicability for measuring small objects with high fidelity.
Main Methods:
- Development of an all-fiber incoherent interferometer operating at an eye-safe wavelength (1.55 µm).
- Implementation of a rotating scanner for axial scanning, enabling a wide longitudinal scanning range.
- Acquisition and analysis of high-resolution 3D images of various samples, including a 100 yen Japanese coin.
Main Results:
- Achieved high sensitivity of 102 dB and axial resolution of 1.4 µm from several meters.
- Demonstrated a wide longitudinal scanning range of 54 mm.
- Obtained high-resolution images of samples at a measurement speed of 52 points/s.
- Evaluated performance metrics including resolution, sensitivity, speed, and angle dependence.
Conclusions:
- The demonstrated all-fiber incoherent interferometer system offers a practical solution for high-performance 3D measurements.
- The system exhibits excellent sensitivity, resolution, and scanning capabilities, suitable for diverse applications.
- The study validates the system's effectiveness for detailed metrology of small objects, even with variations in surface angle.
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