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Updated: Jul 5, 2026

Implementation of a Reference Interferometer for Nanodetection

Implementation of a Reference Interferometer for Nanodetection

Published on: April 26, 2014

High-accuracy absolute distance measurement using frequency comb referenced multiwavelength source.

Yves Salvadé¹, Nicolas Schuhler, Samuel Lévêque

¹Haute Ecole ARC Ingénierie, St-Imier, Switzerland. yves.salvade@he-arc.ch

|May 13, 2008

Summary

We developed a novel multiple-wavelength interferometry method for precise, long-distance measurements. This technique achieves nanometer accuracy, enabling high-bandwidth absolute distance determination for moving targets.

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Area of Science:

Optics and Photonics
Metrology
Laser Interferometry

Background:

Accurate distance measurement is crucial in various scientific and industrial applications.
Traditional interferometry methods face limitations in range and accuracy for dynamic measurements.

Purpose of the Study:

To introduce a new multiple-wavelength interferometry approach for high-bandwidth absolute distance measurement.
To achieve nanometer accuracy over extended distances using tunable synthetic wavelengths.

Main Methods:

Utilizing two continuous-wave (cw) lasers stabilized by an optical frequency comb.
Generating a wide selection of synthetic wavelengths.
Employing a superheterodyne detection technique for measurement.

Main Results:

Demonstrated experimental accuracy of 8 nanometers over a distance of 800 millimeters.
Successfully measured targets moving at velocities up to 50 millimeters per second.
Achieved unprecedented choice of synthetic wavelengths for enhanced measurement flexibility.

Conclusions:

The proposed method offers a significant advancement in absolute distance measurement.
The technique provides high accuracy and bandwidth for dynamic metrology applications.
This approach opens new possibilities for precision engineering and scientific research.