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Updated: Jul 4, 2026

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
Sapphire-GaN-based planar integrated free-space optical system
M Hofmann1, S Hauguth-Frank, V Lebedev
1Institute of Micro- and Nanotechnologies, Optical Engineering, Technical University Ilmenau, Ilmenau, Germany.
Abstract:
We report on the design and fabrication of a planar integrated free-space optical system working on the basis of binary phase diffractive optical elements (DOEs) realized in GaN on a sapphire substrate. Group III-nitride/sapphire substrates enable the parallel monolithic integration of passive microoptical elements like lenses and gratings as demonstrated here and optoelectronic devices like light emitters and photodetectors on a single wafer. We present an approach for the simultaneous optimization of the efficiency of transmissive and reflective diffractive optical elements processed in a single lithographic etching step.

