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A simple technique for the estimation of the voltage of a transmission electron microscope
Abstract:
A convergent beam electron diffraction (CBED) technique has been described for the determination of the voltage of a transmission electron microscope (TEM). It involves observing the intersections of HOLZ lines, (1 3 13), (3 1 13), (10 10 8) and (10 10 8), in the transmitted disc of the CBED pattern obtained along the [37 37 4] zone axis of silicon. It is suitable for the TEMs with operational voltage in the range of 200 kV, and is also free from the tilt limitations.
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