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Updated: Jul 4, 2026

Implementation of a Reference Interferometer for Nanodetection
Published on: April 26, 2014
Zongtao Ge1, Takayuki Saito, Minoru Kurose
1Fujinon Corporation 1-324, Uetake, Saitama City, Saitama 330-8624, Japan. zongtao-ge@msv.fujinon.co.jp
A new interferometer simplifies wavefront measurement for multi-wavelength optical pickups using reflection dot pinhole mirrors. This flexible design achieves high numerical aperture measurements and calibrates aberrations effectively.
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