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Updated: Jul 4, 2026

Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
Published on: April 18, 2019
Effect of carrier lifetime on forward-biased silicon Mach-Zehnder modulators
Gui-Rong Zhou1, Michael W Geis, Steven J Spector
1Research Laboratory of Electronics, Massachusetts Institute of Technology, Cambridge, MA 02139, USA. guirong@mit.edu
Abstract:
We present a systematic study of Mach-Zehnder silicon optical modulators based on carrier-injection. Detailed comparisons between modeling and measurement results are made with good agreement obtained for both DC and AC characteristics. A figure of merit, static VpiL, as low as 0.24Vmm is achieved. The effect of carrier lifetime variation with doping concentration is explored and found to be important for the modulator characteristics.
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