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Published on: August 29, 2017
Design of multilayer antireflection coatings made from co-sputtered and low-refractive-index materials by genetic
Martin F Schubert1, Frank W Mont, Sameer Chhajed
1Future Chips Constellation, Rensselaer Polytechnic Institute, Troy, NY 12180, USA.
Abstract:
Designs of multilayer antireflection coatings made from co-sputtered and low-refractive-index materials are optimized using a genetic algorithm. Co-sputtered and low-refractive-index materials allow the fine-tuning of refractive index, which is required to achieve optimum anti-reflection characteristics. The algorithm minimizes reflection over a wide range of wavelengths and incident angles, and includes material dispersion. Designs of antireflection coatings for silicon-based image sensors and solar cells, as well as triple-junction GaInP/GaAs/Ge solar cells are presented, and are shown to have significant performance advantages over conventional coatings. Nano-porous low-refractive-index layers are found to comprise generally half of the layers in an optimized antireflection coating, which underscores the importance of nano-porous layers for high-performance broadband and omnidirectional antireflection coatings.
