Updated: Jul 4, 2026

Single-Digit Nanometer Electron-Beam Lithography with an Aberration-Corrected Scanning Transmission Electron Microscope
Published on: September 14, 2018
11Department of Electrical and Computer Engineering, University of California at San Diego, 9500 Gilman Drive, La Jolla, California 92093-0407, USA. joe@triagewireless.com
A novel two-beam-current method enhances electron-beam (e-beam) writing for gray-scale mask fabrication. This technique significantly expands dynamic range and reduces writing time for high-resolution micro-optical elements.
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