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Spectral and Angle-Resolved Magneto-Optical Characterization of Photonic Nanostructures
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Multilayer coatings monitoring using admittance diagram

Cheng-Chung Lee1, Yu-Jen Chen

  • 1Thin Film Technology Center/Department of Optics and Photonics, National Central University, Chung-Li, Taiwan. cclee@dop.ncu.edu.tw

Optics Express
|June 12, 2008
PubMed

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