Related Experiment Video
Updated: Jul 4, 2026
05:57
Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
High precision optical characterization of semiconductor saturable absorber mirrors
D J Maas1, B Rudin, A-R Bellancourt
1Department of Physics, Institute of Quantum Electronics, ETH Zurich, Wolfgang-Pauli-Str. 16, 8093 Zurich, Switzerland.
Optics Express
|June 12, 2008
Summary
We present a new, accurate, and cost-efficient method for measuring nonlinear optical reflectivity in semiconductor saturable absorber mirrors (SESAMs). This technique enhances the optimization of SESAMs for ultrafast lasers, enabling higher repetition rates and pulse energies.
Area of Science:
- Optics and Photonics
- Materials Science
- Laser Physics
Background:
- Semiconductor saturable absorber mirrors (SESAMs) are crucial components in ultrafast laser systems.
- Accurate characterization of nonlinear optical reflectivity is essential for optimizing SESAM performance.
- Existing measurement techniques can be complex, costly, or lack the required dynamic range and accuracy.
Purpose of the Study:
- To introduce a novel, simplified, and cost-efficient method for measuring nonlinear optical reflectivity.
- To achieve high accuracy (<0.05%) in nonlinear reflectivity measurements.
- To enable wide dynamic range measurements applicable to various SESAM designs and laser parameters.
Main Methods:
- Development of a new measurement scheme for nonlinear optical reflectivity.
- Implementation of a simplified and cost-efficient experimental setup.
- Validation of the method across different wavelength regions and fluence ranges.
Main Results:
- Achieved measurement accuracy of less than 0.05%.
- Demonstrated a simpler and more cost-efficient measurement scheme compared to previous systems.
- The method proved easily implementable for arbitrary wavelength regions and fluence ranges.
Conclusions:
- The developed method provides a highly accurate and practical approach for nonlinear reflectivity measurements of SESAMs.
- This technique facilitates the optimization of SESAMs for advanced ultrafast laser applications, including high repetition rate and high pulse energy lasers.
- The simplicity and cost-effectiveness make this method widely accessible for SESAM characterization and development.
