Related Experiment Video
Updated: Jul 4, 2026
Probing C84-embedded Si Substrate Using Scanning Probe Microscopy and Molecular Dynamics
Published on: September 28, 2016
Investigation of CdS thin films by a near-field microwave microprobe
Tigran Sargsyan1, Artur Hovsepyan, Harutyun Melikyan
1Department of Physics and Interdisciplinary Program of Integrated Biotechnology, Sogang University, Seoul 121-742, Republic of Korea.
Abstract:
Cadmium sulphide (CdS) thin films with different microstructures and morphologies were measured by using a near-field microwave microprobe (NFMM). The NFMM system was coupled to a dielectric resonator with a distance regulation system at an operating frequency f=4.1 GHz. The changes in dielectric permittivity of CdS thin films due to different annealing temperatures were investigated by measuring the reflection coefficient S(11). CdS thin films with different microstructures and morphology were characterized by X-ray diffraction, atomic force microscopy and NFMM.
