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Updated: Jul 4, 2026

Polarization-Sensitive Two-Photon Microscopy for a Label-Free Amyloid Structural Characterization
Published on: September 8, 2023
1Department of Molecular Biology and Genetics, Cornell University, Ithaca, NY 14853, USA. rt77@cornell.edu
This study presents an improved sampling field sensor (SFS) for simultaneous X, Y, and XY shearing interferometry. The compact and vibration-insensitive device offers accurate phase, amplitude, and polarization imaging for biological samples.
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