Thermal Strain
Imperfections in Crystal Structure: Stoichiometric Point Defects
P-N junction
Temperature Dependent Deformation
Imperfections in Crystal Structure: Non-Stoichiometric Defects
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Updated: Jul 3, 2026

The Frequency Domain Thermoreflectance Technique for Thermal Property Measurements
Published on: December 5, 2025
1Materials Science Centre, School of Materials, University of Manchester, Manchester M1 7HS, UK. Colin.leach@manchester.ac.uk
Scanning electron microscopy revealed distinct electrical properties at thermistor grain boundaries above the Curie temperature. Different structures, including Schottky barriers and n-i-n interfaces, were identified, influencing conductivity.
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