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Sample cell for EXAFS measurements on molten materials at elevated temperatures.
J C Mikkelsen1, J B Boyce, R Allen
1Xerox Palo Alto Research Center, Palo Alto, California 94304, USA.
The Review of Scientific Instruments
|March 1, 1980
Summary
Researchers developed a simple, cost-effective sample cell for high-temperature extended x-ray absorption fine structure (EXAFS) studies. This cell maintains sample integrity for solids and liquids up to 1000°C.
Area of Science:
- Materials Science
- Analytical Chemistry
- Physical Chemistry
Background:
- Extended X-ray Absorption Fine Structure (EXAFS) spectroscopy is a powerful technique for determining local atomic structure.
- High-temperature measurements are crucial for understanding material behavior under relevant operating conditions.
- Existing sample cells for high-temperature EXAFS can be complex, expensive, or difficult to fabricate.
Purpose of the Study:
- To design and fabricate a simple, cost-effective sample cell for high-temperature EXAFS measurements.
- To demonstrate the cell's capability in maintaining sample integrity at elevated temperatures.
- To enable reliable EXAFS analysis of both solid and liquid samples up to 1000°C.
Main Methods:
- Design and fabrication of a novel sample cell using readily available materials.
- Rigorous testing of the cell's thermal stability and inertness.
- Utilization of the cell for EXAFS measurements on various solid and liquid samples at temperatures up to 1000°C.
Main Results:
- The fabricated sample cell proved to be rigid, inert, and easy to construct.
- The cell effectively maintained the critical specimen dimensions for both solid and liquid samples.
- Successful EXAFS data were collected at temperatures up to 1000°C, demonstrating the cell's utility.
Conclusions:
- A simple and inexpensive sample cell for high-temperature EXAFS has been successfully developed.
- This cell facilitates reliable structural analysis of materials at extreme temperatures.
- The design offers a practical solution for researchers studying high-temperature phenomena using EXAFS spectroscopy.

