An analytical approach to estimating aberrations in curved multilayer optics for hard x-rays: 1. Derivation of

J-P Guigay1, Ch Morawe, V Mocella

  • 1ESRF, BP 220, 6, rue Jules Horowitz, F-38043 Grenoble cedex, France. guigay@esrf.fr

Optics Express
|August 6, 2008
PubMed

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