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Updated: Jul 3, 2026
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Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
Published on: June 19, 2018
A new large radius imaging plate camera for high-resolution and high-throughput synchrotron x-ray powder diffraction
Masahiko Tanaka1, Yoshio Katsuya, Akiji Yamamoto
1NIMS Beamline Station at SPring-8, National Institute for Materials Science, 1-1-1 Kouto, Sayo-cho, Hyogo, Japan.
The Review of Scientific Instruments
|August 7, 2008
Summary
A new large radius imaging plate camera enhances synchrotron X-ray powder diffraction for high-resolution, high-throughput analysis. This system achieves rapid data collection, enabling efficient structural studies with Rietveld analysis.
Area of Science:
- Materials Science
- Crystallography
- Synchrotron Radiation
Background:
- Developing advanced instrumentation is crucial for high-resolution synchrotron X-ray powder diffraction.
- Existing methods may face limitations in throughput and data acquisition speed.
Purpose of the Study:
- To introduce a novel large radius imaging plate diffraction camera for synchrotron X-ray powder diffraction.
- To achieve high-resolution and high-throughput data collection.
Main Methods:
- A large radius (954.9 mm cylinder radius) imaging plate camera was developed and mounted on a diffractometer at SPring-8.
- Multiple exposures with varying 2 theta angles were used to cover a wide angular range.
- Data processing involved translating exposures to 2 theta-intensity format and merging overlapped regions.
Main Results:
- The total measurement time for a powder diffraction pattern is under 20 minutes, comparable to continuous scanning methods.
- The camera provides a resolution higher than second-generation synchrotron sources but lower than third-generation diffractometers with analyzers.
- Successful Rietveld analysis was performed on NBS-CeO2 using the collected data.
Conclusions:
- The new imaging plate camera offers a viable solution for high-throughput synchrotron X-ray powder diffraction.
- It enables efficient data collection and structural analysis, particularly for samples requiring rapid measurements.
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