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Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

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Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
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Inductively Coupled Plasma Atomic Emission Spectroscopy: Principle

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Inductively coupled plasma (ICP) is the most widely used plasma source in atomic emission spectroscopy (AES), also known as Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES). The ICP source, or torch, consists of three concentric quartz tubes with argon gas flowing through them. A spark from a Tesla coil initiates the ionization of argon, generating a high-temperature plasma.
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Atomic Emission Spectroscopy: Lab

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AES is a powerful analytical technique, especially effective when used with plasma sources, producing abundant spectra in characteristic emission lines. The Inductively Coupled Plasma (ICP), in particular, yields superior quantitative analytical data due to its high stability, low noise, low background, and minimal interferences under optimal experimental conditions. However, newer air-operated microwave sources are emerging as promising alternatives that could be more cost-effective than...

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Related Experiment Video

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Applying X-ray Imaging Crystal Spectroscopy for Use as a High Temperature Plasma Diagnostic

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High-pass photocathode x-ray ionization chamber for surface EXAFS.

N J Shevchik¹, D A Fischer

¹Physics Department, State University of New York, Stony Brook, New York 11794.

The Review of Scientific Instruments

|May 1, 1979

Summary

This study introduces a novel x-ray detector utilizing helium gas ionization. The detector achieves high sensitivity for analyzing thin copper layers using extended x-ray absorption fine structure (EXAFS) spectroscopy.

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Area of Science:

Physics
Materials Science
Spectroscopy

Background:

X-ray detectors are crucial for materials analysis.
Existing methods for analyzing thin films can be time-consuming or lack sensitivity.

Purpose of the Study:

To describe a novel x-ray detector design.
To demonstrate its capability for sensitive elemental analysis of thin films.

Main Methods:

The detector collects electrons emitted from a cathode.
Amplification is achieved through field-intensified ionization in helium gas.
Detector current is measured as a function of x-ray frequency.

Main Results:

Detector sensitivity increases significantly above the photocathode's absorption edge.
Extended x-ray absorption fine structure (EXAFS) of 30 Å copper layers was obtained in minutes.
The method shows high sensitivity and speed for thin film analysis.

Conclusions:

The described x-ray detector offers a sensitive and rapid method for materials characterization.
This technology has potential applications in thin film analysis and materials science research.