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Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
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Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method

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Noninvasive beam-wave spectrometric instrumentation for measuring dielectric constant at microwave frequencies

P S Neelakantaswamy1, R Govindarajan

  • 1Department of Electrical Engineering, Indian Institute of Technology, Madras 600036, India.

The Review of Scientific Instruments
|May 1, 1979
PubMed

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