Noise in large-aperture self-scanned diode arrays
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Updated: Jul 2, 2026

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Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
1EG&G Princeton Applied Research, P. O. Box 2565, Princeton, New Jersey 08540, USA.
The Review of Scientific Instruments
|June 1, 1979
Abstract:
An equation for the random noise of self-scanned silicon photodiode arrays is developed which includes significant terms not previously considered. It is shown that, including these terms, the new 2.5-mm-high self-scanned arrays are only slightly noisier than older arrays; but because of their much greater aperture, they can detect much smaller light fluxes than the older arrays even when used with simple, inexpensive amplifiers.

