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Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
Noise in large-aperture self-scanned diode arrays
1EG&G Princeton Applied Research, P. O. Box 2565, Princeton, New Jersey 08540, USA.
The Review of Scientific Instruments
|June 1, 1979
Summary
A new equation for silicon photodiode array noise reveals that larger, newer arrays detect smaller light fluxes despite slightly increased noise. These advanced arrays offer superior sensitivity with simple amplifiers.
Area of Science:
- Optoelectronics
- Solid-state physics
Background:
- Self-scanned silicon photodiode arrays are crucial for light detection.
- Understanding noise is essential for optimizing detector performance.
Purpose of the Study:
- To develop a comprehensive noise equation for self-scanned silicon photodiode arrays.
- To compare the noise performance and light flux detection capabilities of new and older array designs.
Main Methods:
- Formulating a novel equation for random noise in self-scanned silicon photodiode arrays.
- Incorporating previously neglected significant noise terms into the equation.
- Analyzing the noise characteristics and sensitivity of 2.5-mm-high arrays.
Main Results:
- The developed equation accurately models photodiode array noise, including new significant terms.
- New 2.5-mm-high arrays exhibit only slightly higher noise levels than older designs.
- Despite comparable noise, the larger aperture of new arrays enables detection of much smaller light fluxes.
Conclusions:
- The new noise equation provides a more complete understanding of silicon photodiode array performance.
- Advanced self-scanned photodiode arrays offer enhanced light flux detection sensitivity.
- These arrays are suitable for applications requiring sensitive light detection with basic amplification setups.

