Submicron scale patterning in sintered silica colloidal crystal films using a focused ion beam

Jeffrey L Moran1, Philip M Wheat, Jonathan D Posner

  • 1Department of Mechanical and Aerospace Engineering, Arizona State University, Tempe, AZ 85287-6106, USA.

Summary

Focused ion beam milling precisely patterns silica colloidal crystals for microdevices. This technique creates various structures, enabling applications in photonics and microfluidics.

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