Related Experiment Video
Updated: Jul 2, 2026

08:12
Ohmic Contact Fabrication Using a Focused-ion Beam Technique and Electrical Characterization for Layer Semiconductor Nanostructures
Published on: December 5, 2015
Submicron scale patterning in sintered silica colloidal crystal films using a focused ion beam
Jeffrey L Moran1, Philip M Wheat, Jonathan D Posner
1Department of Mechanical and Aerospace Engineering, Arizona State University, Tempe, AZ 85287-6106, USA.
Langmuir : the ACS Journal of Surfaces and Colloids
|August 21, 2008
Summary
Focused ion beam milling precisely patterns silica colloidal crystals for microdevices. This technique creates various structures, enabling applications in photonics and microfluidics.
Area of Science:
- Materials Science
- Nanotechnology
- Microfabrication
Background:
- Colloidal crystals are versatile materials for photonic and microfluidic applications.
- Precise patterning of colloidal crystals is crucial for fabricating advanced devices.
- Existing fabrication methods may have limitations in resolution or speed.
Purpose of the Study:
- To demonstrate the capability of focused ion beam (FIB) milling for fabricating microscale patterns in sintered silica colloidal crystal films.
- To explore the control over surface properties (porous vs. solid) during FIB milling.
- To highlight the potential applications of FIB direct patterning in advanced technologies.
Main Methods:
- Focused ion beam (FIB) milling was employed to pattern sintered silica colloidal crystal films.
- Fabrication of micron and submicron scale features, including cavities and channels, was achieved.
- Analysis of redeposited material to understand its effect on surface characteristics.
Main Results:
- Micron and submicron scale patterns, such as rectangular cavities and fluidic channels, were successfully fabricated.
- FIB milling enabled patterning of individual submicron spheres and large areas (up to 40 µm) in under 15 minutes.
- The amount of redeposited material was identified as the key factor determining the porosity of milled surfaces.
Conclusions:
- FIB direct patterning is an effective method for high-resolution fabrication in silica colloidal crystals.
- The technique offers precise control over pattern geometry and surface properties.
- This method has significant potential for applications in colloidal crystal-based lithography, integrated photonics, optofluidics, and micro-total analytical systems.

