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From Voxels to Knowledge: A Practical Guide to the Segmentation of Complex Electron Microscopy 3D-Data
Published on: August 13, 2014
Tryphon Georgiou1, Oleg Michailovich, Yogesh Rathi
1Tryphon Georgiou is with the Department of Electrical and Computer Engineering, University of Minnesota, Minneapolis, MN, 55455 (email: georgiou@ece.umn.edu ). O. Michailovich was with the School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA 30332 USA. He is currently with the Department of Electrical and Computer Engineering, University of Alberta, Canada T6G 2E1 (e-mail: olegm@ece.ualberta.ca ). Y. Rathi, James Malcolm, A. Tannenbaum are with the School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, GA 30332 USA (e-mail: yogesh.rathi@gatech.edu ; malcolm@ece.gatech.edu ; tannenba@ece.gatech.edu ). Tannenbaum is also with the Department of Electrical Engineering, Technion, Israel where he is supported by a Marie Curie Grant through the EU.
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