High resolution Talbot self-imaging applied to structural characterization of self-assembled monolayers of

J Garcia-Sucerquia1, D C Alvarez-Palacio, H J Kreuzer

  • 1Physics School, Universidad Nacional de Colombia Sede Medellín, A.A. 3840 Medellín, Colombia. jigarcia@unal.edu.co

Applied Optics
|September 12, 2008
PubMed

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