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In Depth Analyses of LEDs by a Combination of X-ray Computed Tomography (CT) and Light Microscopy (LM) Correlated with Scanning Electron Microscopy (SEM)

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[X-ray hardening correction for ICT in testing workpiece].

Guang-han Peng¹, Xin-hua Cai, Zhong Han

¹College of Physics and Electronic Science, Hunan University of Arts and Science, Changde 415000, China. pengguanghan@yahoo.com.cn

Guang Pu Xue Yu Guang Pu Fen Xi = Guang Pu

|September 20, 2008

Summary

X-ray beam hardening in industrial computerized tomography causes image artifacts. This study analyzes the phenomenon and develops a correction method using X-ray beam sum and material thickness for accurate reconstructions.

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Area of Science:

Physics
Materials Science
Computerized Tomography

Context:

Industrial computerized tomography (CT) utilizes polychromatic X-ray sources.
X-ray attenuation varies with energy, leading to preferential absorption of lower energy photons.
Material transmission thickness influences X-ray penetration and spectral composition.

Purpose:

To analyze the X-ray beam hardening phenomenon in materials.
To establish a relationship between X-ray beam sum and transmission thickness.
To develop and implement a hardening correction method for accurate CT imaging.

Summary:

The study investigates X-ray beam hardening, where polychromatic X-rays shift towards higher energies after material transmission.
A correlation between X-ray beam sum and material thickness is derived using Beer's law.
The derived relationship enables correction of X-ray beam hardening, mitigating its impact on CT image reconstruction.

Impact:

Effective removal of X-ray beam hardening artifacts in industrial CT.
Improved accuracy and reliability of reconstructed images in industrial applications.
Enhanced quality of non-destructive testing and material analysis using CT.