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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

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Published on: October 11, 2016

Measurement of two-dimensional small angle deviation with a prism interferometer.

Sanjib Chatterjee¹, Y Pavan Kumar

¹Raja Ramanna Centre for Advanced Technology, Department of Atomic Energy, Government of India, Indore-452013, India. schat@cat.ernet.in

|September 23, 2008

Summary

A novel technique measures two-dimensional small angular deviation using a compound prism and plane reference surfaces. This method offers high sensitivity for precise angular tilt measurements, even in vibrating environments.

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Area of Science:

Optical Metrology
Interferometry
Precision Measurement

Background:

Measuring small angular deviations is crucial in various scientific and engineering fields.
Existing techniques may lack sensitivity or be susceptible to environmental disturbances like vibrations.

Purpose of the Study:

To present a new, highly sensitive technique for measuring two-dimensional small angular deviation.
To introduce a monolithic prism interferometer design that is insensitive to vibration.

Main Methods:

Utilizing a compound prism (two right-angled prisms in orthogonal directions) and plane reference surfaces.
Measuring orthogonal components of angular tilt by analyzing wedge fringe rotation.
Developing a monolithic prism interferometer for enhanced stability.

Main Results:

Demonstrated high sensitivity in measuring small angle deviations.
Successfully measured a known tilt angle with the proposed technique.
Proposed a vibration-insensitive monolithic prism interferometer.

Conclusions:

The presented technique provides a sensitive method for two-dimensional angular deviation measurement.
The monolithic prism interferometer offers a robust solution for applications requiring high stability.