X-ray Crystallography
Determination of Crystal Structures
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Updated: Jun 29, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
Sam Campbell1, Lindsay C Botten, Ross C McPhedran
1Centre for Ultrahigh Bandwidth Devices for Optical Systems, School of Physics, University of Sydney, NSW 2006, Australia.
This study generalizes modal diffraction for slanted lamellar gratings, enhancing analysis of dielectric and lossy materials. The new method accurately models highly slanted gratings, offering versatile numerical verification.
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