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The Solid-State X-Ray Image Intensifier (SSXII): An EMCCD-Based X-Ray Detector.

Andrew Kuhls-Gilcrist¹, Girijesh Yadava, Vikas Patel

¹University at Buffalo (State University of New York), Toshiba Stroke Research Center, 3435 Main St., Buffalo, NY USA 14214.

Proceedings of Spie--The International Society for Optical Engineering

|October 7, 2008

Summary

A new solid-state x-ray image intensifier (SSXII) offers superior high-resolution, real-time imaging. This EMCCD-based detector overcomes limitations of current flat panel detectors and x-ray image intensifiers, showing negligible noise even at low exposures.

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X-ray Dose Reduction through Adaptive Exposure in Fluoroscopic Imaging

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Area of Science:

Medical Imaging
Detector Technology
X-ray Imaging

Background:

Current flat panel detectors (FPDs) and x-ray image intensifiers (XIIs) have limitations in resolution, lag, ghosting, and noise.
FPDs offer improvements over XIIs by reducing distortions but still struggle with low-exposure performance.
Existing detectors are limited to approximately 3 cycles/mm resolution.

Purpose of the Study:

To develop and evaluate a novel solid-state x-ray image intensifier (SSXII) based on EMCCD technology.
To assess the SSXII's performance against current state-of-the-art detectors in terms of resolution, noise, and efficiency.
To demonstrate the SSXII's capability for high-resolution, real-time x-ray imaging.

Main Methods:

A prototype SSXII module was constructed using a 1k x 1k EMCCD and a CsI(Tl) phosphor viewed via a fiber-optic taper.
Modulation Transfer Function (MTF), Detective Quantum Efficiency (DQE), and instrumentation-noise equivalent exposure (INEE) were measured.
Performance was evaluated using a standard x-ray spectrum (IEC RQA5) and compared with existing detectors.

Main Results:

The SSXII achieved an MTF of 0.20 at 3 cycles/mm and exceeded 0.05 up to 7 cycles/mm, surpassing current capabilities.
DQE showed minimal degradation across a wide range of exposures, from high-angiographic to low-fluoroscopic levels.
Negligible instrumentation noise was observed, with an INEE of < 0.2 muR in the highest-resolution mode.

Conclusions:

The developed SSXII module demonstrates significant improvements in resolution and low-noise performance compared to FPDs and XIIs.
The SSXII technology is well-suited for low-exposure procedures requiring high-resolution real-time imaging.
Arrays of SSXII modules can provide a larger field-of-view for advanced x-ray imaging applications.