Determination of Crystal Structures
X-ray Crystallography
Bending
Unit Cells
Crystal Field Theory - Tetrahedral and Square Planar Complexes
Crystal Density
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Updated: Jun 29, 2026

Effect of Bending on the Electrical Characteristics of Flexible Organic Single Crystal-based Field-effect Transistors
Published on: November 7, 2016
Takashi Yamazaki1, Akihiro Kashiwagi, Koji Kuramochi
1Department of Physics, Tokyo University of Science, Tokyo, Japan. yamazaki@rs.kagu.tus.ac.jp
This study quantifies crystal bending near interfaces using convergent beam electron diffraction (CBED). The method reveals thin-foil relaxation in SiGe/Si, measuring a 0.3-degree bend approximately 10 nm from the interface.
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