A computer-controlled data acquisition and analysis system for use in the characterization of plasma atomic emission

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Updated: Jun 28, 2026

Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
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Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis

Published on: May 10, 2021

J P Shields1, E H Piepmeier

  • 1Department of Chemistry Oregon State University Corvallis Oregon 97331 USA.

The Journal of Automatic Chemistry
|January 1, 1991
PubMed

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