Related Experiment Video
Updated: Jun 28, 2026
07:24
Quantitative Atomic-Site Analysis of Functional Dopants/Point Defects in Crystalline Materials by Electron-Channeling-Enhanced Microanalysis
Published on: May 10, 2021
A computer-controlled data acquisition and analysis system for use in the characterization of plasma atomic emission
1Department of Chemistry Oregon State University Corvallis Oregon 97331 USA.
The Journal of Automatic Chemistry
|January 1, 1991
Summary
This study presents a flexible data acquisition system for characterizing spectroscopic plasma sources. The system enables real-time spatial and temporal emission analysis, aiding in experimental optimization.
Area of Science:
- Atomic Emission Spectroscopy
- Plasma Physics
- Spectroscopy Instrumentation
Background:
- Characterizing new spectroscopic plasma sources requires detailed spatial and temporal emission data.
- Real-time graphical feedback is crucial for optimizing experimental parameters.
Purpose of the Study:
- To describe a flexible data acquisition system for atomic emission spectroscopy.
- To enable real-time spatial and temporal analysis of plasma emission.
- To demonstrate the system's utility in optimizing spectroscopic instrumentation.
Main Methods:
- Interfacing an echelle spectrometer with an IBM-PC compatible microcomputer.
- Utilizing FORTH-based ASYST software for real-time data display and control.
- Employing a computer-controlled mirror for spatial imaging onto the spectrometer's entrance slit.
Main Results:
- Demonstrated two-dimensional spatial profiles of plasma emission.
- Successfully monitored plasma stability over time.
- Illustrated optimization of echelle spectrometer components (aperture plate, photomultiplier tube).
Conclusions:
- The developed system provides a flexible and effective tool for characterizing plasma sources.
- Real-time data acquisition and graphical display facilitate experimental parameter optimization.
- The system enhances the study of atomic emission spectroscopy by providing detailed spatial and temporal insights.
Related Concept Videos
01:26Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation
Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
There are three main types of inductively coupled plasma atomic emission spectroscopy (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used.
There are three main types of inductively coupled plasma atomic emission spectroscopy (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used.
01:19Inductively Coupled Plasma Atomic Emission Spectroscopy: Principle
Inductively coupled plasma (ICP) is the most widely used plasma source in atomic emission spectroscopy (AES), also known as Inductively Coupled Plasma Optical Emission Spectroscopy (ICP-OES). The ICP source, or torch, consists of three concentric quartz tubes with argon gas flowing through them. A spark from a Tesla coil initiates the ionization of argon, generating a high-temperature plasma.
The ions and electrons produced interact with the fluctuating magnetic field created by a water-cooled...
The ions and electrons produced interact with the fluctuating magnetic field created by a water-cooled...
01:20Atomic Emission Spectroscopy: Overview
Atomic emission spectroscopy (AES) is an analytical technique used to determine the elemental composition of a sample by analyzing the light emitted from excited atoms. In AES, atoms in a sample are excited to higher energy levels by thermal energy from high-temperature sources, such as plasma, arcs, or sparks. When these excited atoms return to lower energy states, they emit light at specific wavelengths characteristic of each element. The resulting atomic emission spectrum, which consists of...
01:22Atomic Emission Spectroscopy: Instrumentation
The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers. Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.
01:29Atomic Emission Spectroscopy: Lab
AES is a powerful analytical technique, especially effective when used with plasma sources, producing abundant spectra in characteristic emission lines. The Inductively Coupled Plasma (ICP), in particular, yields superior quantitative analytical data due to its high stability, low noise, low background, and minimal interferences under optimal experimental conditions. However, newer air-operated microwave sources are emerging as promising alternatives that could be more cost-effective than...
01:22Atomic Absorption Spectroscopy: Instrumentation
An atomic absorption spectrophotometer (AAS) comprises several components: a radiation source, an atomizer, a monochromator, and a detector. The radiation source can be a hollow-cathode lamp (HCL) or an electrodeless-discharge lamp (EDL), both of which provide a narrow emission line of the required wavelength. However, some instruments use continuum sources and high-resolution monochromators to achieve a narrow range of radiation.
The atomizer used in AAS can be either a flame atomizer or an...
The atomizer used in AAS can be either a flame atomizer or an...