Related Experiment Video
Updated: Jun 28, 2026

Recombination Dynamics in Thin-film Photovoltaic Materials via Time-resolved Microwave Conductivity
Published on: March 6, 2017
Trace analysis by microwave excitation of sealed samples-I: preliminary investigations
A van Sandwijk1, P F van Montfort, J Agterdenbos
1Analytisch Chemisch Laboratorium, Rijksuniversiteit Utrecht, Croesestraat 77A, Utrecht, Netherlands.
Abstract:
An important limitation to the sensitivity of analytical methods using atomic spectroscopy is the short residence-time of the atoms in the light-path. The possibility has been studied of sealing the samples in a quartz tube where they are forced to emit light by microwave excitation. The detection of amounts below one ng in a volume of 0.5 ml seems possible.
More Related Videos
07:38Carrier Lifetime Measurements in Semiconductors through the Microwave Photoconductivity Decay Method
Published on: April 18, 2019
10:35Using Microwave and Macroscopic Samples of Dielectric Solids to Study the Photonic Properties of Disordered Photonic Bandgap Materials
Published on: September 26, 2014