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Updated: Jun 28, 2026

Energy Dispersive X-ray Tomography for 3D Elemental Mapping of Individual Nanoparticles
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Published on: July 5, 2016

Trace element analysis by particle and photon-induced X-ray emission spectroscopy

B Gonsior1, M Roth

  • 1Institut für Experimentalphysik, Ruhr-Universität Bochum, Postfach 102148, D-4630 Bochum, F.R.G.

Talanta
|June 1, 1983
PubMed
Summary

Particle- and photon-induced X-ray emission spectroscopy are vital for trace element analysis, particularly with limited sample sizes. This review covers their physical principles, methods, and applications.

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