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05:57
Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
Published on: April 1, 2020
Dual-channel optical phase measurement system for improved precision.
Ruey-Ching Twu1, Hao-Yang Hong, Hsuan-Hsien Lee
1Department of Electro-Optical Engineering, Southern Taiwan University, Tainan, Taiwan. rctwu@mail.stut.edu.tw
Optics Letters
|November 4, 2008
Summary
A new dual-channel phase measurement system uses optical homodyne techniques for precise measurements. This system achieves high stability in simultaneously measuring phase differences in transmitted and reflected light.
Area of Science:
- Optics and Photonics
- Quantum Optics
- Optical Metrology
Background:
- Phase measurement is crucial in various optical sensing applications.
- Existing techniques may face limitations in stability and simultaneous measurement capabilities.
- Lithium niobate modulators offer potential for stable phase modulation.
Purpose of the Study:
- To propose and experimentally validate a dual-channel phase measurement system.
- To demonstrate simultaneous measurement of phase differences in transmitted and reflected light.
- To assess the stability and performance of the developed system.
Main Methods:
- Utilizing an optical homodyne technique for phase detection.
- Employing a near-stable Zinc-indiffused Lithium Niobate phase modulator for modulation.
- Implementing a non-polarization beam splitter for signal division.
- Conducting simultaneous measurements of phase-retardation differences.
Main Results:
- Successful implementation of a dual-channel phase measurement system.
- Demonstrated simultaneous measurement of phase-retardation difference between transmitted and reflected light.
- Achieved a measured stability of approximately 0.0013 radians for the phase-retardation difference.
Conclusions:
- The proposed dual-channel system effectively performs simultaneous phase measurements.
- The use of a Zn-indiffused Lithium Niobate modulator contributes to high measurement stability.
- This technique shows promise for advanced optical sensing and metrology applications.
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