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Updated: Jun 28, 2026

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
05:57

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station

Published on: April 1, 2020

Dual-channel optical phase measurement system for improved precision

Ruey-Ching Twu1, Hao-Yang Hong, Hsuan-Hsien Lee

  • 1Department of Electro-Optical Engineering, Southern Taiwan University, Tainan, Taiwan. rctwu@mail.stut.edu.tw

Optics Letters
|November 4, 2008
PubMed

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