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Atomic Force Microscopy

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...

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Related Experiment Video

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High-Speed Atomic Force Microscopy Imaging of DNA Three-Point-Star Motif Self Assembly Using Photothermal Off-Resonance Tapping

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Probe tips functionalized with colloidal nanocrystal tetrapods for high-resolution atomic force microscopy imaging

Concetta Nobile¹, Paul D Ashby, P James Schuck

¹National Nanotechnology Laboratory of CNR-INFM, Distretto Tecnologico ISUFI, Via per Arnesano, Lecce 73100, Italy.

Small (Weinheim an Der Bergstrasse, Germany)

|November 6, 2008

Summary

No abstract available in PubMed .

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